CIF of Lovely Professional University is equipped with sophisticated instruments to carry out spectral measurements, structure determination and chemical analysis. Click on the instrument name in the following table to view their description.
This Bruker equipment benchmark when it comes to extracting structural information from X-Ray Powder Diffraction including Rietveld (TOPAS) analysis, "total" scattering (PDF analysis), and Small Angle X-Ray Scattering (SAXS).
Monochromatic Kα1 radiation with Johansson monochromators for Co, Cu and Mo radiation Highest intensity with focusing Göbel mirrors for Cr, Co, Cu, Mo and Ag radiation. Dynamic Beam Optimization Dynamic Beam Optimization (DBO) provides best in class powder diffraction data by setting new benchmarks in terms of counting statistics and peak-to-background ratio, all without the need for manual instrument reconfiguration.
The high-speed energy-dispersive LYNXEYE XE-T detector uniquely combines fast data collection with unprecedented filtering of fluorescence and Kβ radiation. Its proprietary Variable Active Detector Window and the Motorized Anti-Scatter Screen (MASS) enable data collection from lowest 2θ angles without parasitic low-angle background scattering, in particular air scattering. The fully automated MASS retraction avoids beam cropping, even in combination with continuously variable slits that provide superb counting statistics over the whole angular range.
Superb counting statistics allows for faster data collection and increased sample throughput
No parasitic low-angle background scattering massively improves data quality of pharma, clay, zeolite and other samples having a large unit cell
Best peak-to-background enhances sensitivity for minor phases
Full quantification of crystalline and amorphous phases with DIFFRACTOPAS